low temperature

Quality factor control of a tuning fork resonance between 9 K and 300 K for near-field scanning optical microscopy
G. Ctistis, E. H. Frater, S. R. Huisman, J. P. Korterik, J. L. Herek, W. L. Vos, and P. W. H. Pinkse
J. Phys. D: Appl. Phys. 44, 375502: 1-5 (2011)