Optical characterization and selective addressing of the resonant modes of a micropillar cavity with a white light beam
| Abstract | We have performed white light reflectivity measurements on GaAs/AlAsmicropillar cavities with diameters ranging from 1 μm up to 20 μm. Weare able to resolve the spatial field distribution of each cavity modein real space by scanning a small-sized beam across the top facet ofeach micropillar. We spectrally resolve distinct transverse-opticalcavity modes in reflectivity. Using this procedure we can selectivelyaddress a single mode in the multimode micropillar cavity. Calculationsfor the coupling efficiency of a small-diameter beam to each mode are invery good agreement with our reflectivity measurements. |
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| Authors | G. Ctistis, A. Hartsuiker, E. van der Pol, J. Claudon, W. L. Vos, and J.-M. Gérard |
| Year of publication | 2010 |
| Date published | 11/2010 |
| Journal | Phys. Rev. B |
| Volume | 82 |
| Pages | 195330: 1-7 |
| DOI number | 10.1103/PhysRevB.82.195330 |
| Keywords | GaAs, micropillar cavities, microscopy, planar GaAs/AlAs, reflectivity, resonances |