| Abstract | Photoexcitation and charge carrier thermalization inside semiconductorphotocatalysts are two important steps in solar fuel production. Here,photoexcitation and charge carrier thermalization in a silicon wafer arefor the first time probed by a novel, yet simple and user-friendlyAttenuated Total Reflectance Infrared spectroscopy (ATR-IR) system. |
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| Authors | E. Karabudak, E. Yüce, S. Schlautmann, O. Hansen, G. Mul, H. Gardeniers |
| Year of publication | 2012 |
| Date published | 01/2012 |
| Journal | Phys. Chem. Chem. Phys. |
| Volume | 14 |
| Pages | 10882–10885 |
| Keywords |