Abstract

Metamorphic growth of InP on GaAs has been used to decrease the absorption recovery time of 1.55 micron semiconductor saturable absorber mirrors. We show that the recovery time can be reliably controlled by changing the thickness of an InP “lattice reformation layer” grown between the GaAs-based distributed Bragg reflector and the active region. Semiconductor saturable absorber mirrors with a thickness of the InP reformation layer around 200 nm or smaller exhibit a (ultrafast) recovery time short enough to reliably mode-lock fiber lasers.

Authors

M. Guina, O. Tengvall, A. Vainionpää, S. Karirinne, S. Suomalainen, O. G. Okhotnikov, T. Hakulinen, T. G. Euser, and W. L. Vos

Year of publication

2005

Date published

09/2005

Journal

Appl. Phys. Lett.

Volume

87

Pages

121106: 1-3

Keywords

fast semiconductor, GaAs substrates, mirrors, saturable absorber