Abstract

In this work, electrical square pulses at various duty cycles areapplied to a silicon microsphere resonator in order to continuously tunethe refractive index of a silicon microsphere and to map the opticalresonance in the time domain. A continuous-wave semiconductor diodelaser operating in the L-band is used for the excitation of the siliconmicrosphere optical resonances. The 90 transverse magnetically polarizedelastic scattering signal is used to monitor the silicon microsphereresonances. We show that at a constant input laser wavelength, up tofive high-quality-factor optical resonances can be scanned by dynamicalelectrical tuning of the silicon microsphere cavity.

Authors

A. Serpengüzel, O. Gürlü, E. Yüce, G. J. Thursby

Year of publication

2014

Date published

09/2014

Journal

Appl. Opt.

Volume

53

Pages

6181-6184

Keywords

electrical tuning, microcavity, silicon micropshere, spectroscopy