| Abstract | In this work, electrical square pulses at various duty cycles areapplied to a silicon microsphere resonator in order to continuously tunethe refractive index of a silicon microsphere and to map the opticalresonance in the time domain. A continuous-wave semiconductor diodelaser operating in the L-band is used for the excitation of the siliconmicrosphere optical resonances. The 90 transverse magnetically polarizedelastic scattering signal is used to monitor the silicon microsphereresonances. We show that at a constant input laser wavelength, up tofive high-quality-factor optical resonances can be scanned by dynamicalelectrical tuning of the silicon microsphere cavity. |
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| Authors | A. Serpengüzel, O. Gürlü, E. Yüce, G. J. Thursby |
| Year of publication | 2014 |
| Date published | 09/2014 |
| Journal | Appl. Opt. |
| Volume | 53 |
| Pages | 6181-6184 |
| Keywords | electrical tuning, microcavity, silicon micropshere, spectroscopy |